IP High Court, Reiwa 6 (Ne) 10022 [System providing inspection and analysis services] <Presiding Judge Miyasaka>
更新日：3 日前
Article information
Article type: Case note
Category: Patents
Topics: Claim interpretation, Patent corrections
First published on this website: October 2, 2026
Case number (as stated in the source): Reiwa 6 (Ne) 10022
Display and classification checked: October 2, 2026 (not a re-review of the legal analysis)
IP High Court, Reiwa 6 (Ne) 10022 [System providing inspection and analysis services] <Presiding Judge Miyasaka>
As to the meaning and subject of “inspection and analysis,” the appellant argued that the subject was remote operation itself rather than samples, relying on the exclusion of semiconductor inspection apparatus during prosecution and related circumstances.
<Judgment>
The claims contain no exclusion of semiconductor inspection apparatus. The appellant's argument therefore is not based on the claim wording and cannot be accepted.
The specification's statement about checking whether remote control is possible describes merely one step for inspecting and analyzing a sample; it does not itself mean inspection and analysis.
⇒ Claim elements not satisfied.
Original article: https://lnkd.in/ehyXFaam
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Update and correction history
Substantive corrections and supplements are recorded separately from classification, related-article, and display maintenance.
October 2, 2026: First publication of the author's LinkedIn text. Article type, classification, issue tags, source, and consultation guide were added.
Consultation and inquiries
October 2, 2026: Updated topic tags.
